Students will consider the most common case for thin films, that being normal incidence (θ0=0rad). You may subscribe either as an OSA member, or as an authorized user of your institution. All Rights Reserved, Only if other resources available (images, video, datasets), • Use these formats for best results: Smith or J Smith, Journal of Optical Communications and Networking, Journal of the Optical Society of America A, Journal of the Optical Society of America B, Journal of Display Technology (2005-2016), Journal of the Optical Society of Korea (1997-2016), Journal of Optical Networking (2002-2009), Journal of the Optical Society of America (1917-1983), Conference on Lasers and Electro-Optics (CLEO), Conference on Lasers and Electro-Optics/Pacific Rim, Integrated Photonics Research, Silicon and Nanophotonics, Ray Tracing Using the IBM Card Programmed Electronic Calculator*, Computation of Trichromatic Coordinate Using the IBM 604 Electronic Calculating Punch, Use of a Digital Readout Unit in Converting Spectrophotometric Data to Color Coordinates, Automatic Computation of Dielectric Films. V��,�=����kjx��6Va϶�c�Jُ��^��H4�!`. 0000004504 00000 n J. Opt. Thin films are used commercially in anti-reflection coatings, mirrors, and optical filters. © 2018 The Authors. ScienceDirect ® is a registered trademark of Elsevier B.V. ScienceDirect ® is a registered trademark of Elsevier B.V. Cited by links are available to subscribers only. Methods include chemical vapor deposition and various physical vapor deposition techniques. Login to access OSA Member Subscription. The phase difference becomes δπλ=(201)ntand the film has an index of refraction larger than that of the substrate. William A. Allen and Richard H. Stark Equations are available to subscribers only. Click here to learn more. © Copyright 2020 | The Optical Society. We also show that in the case of multi-layered solar cells the correct summation order of rays is important. In this paper, constructing explicit, exact ray solutions of the one-dimensional Helmholtz equation as a model for optically thin solar cells, we show that the ray-wave duality is also exact in the context of the electromagnetic wave equations. The total contribution ρ of all of the rays of our subclass to the total reflection amplitude r is (D.1) ρ = ∑ p = 0 ∞ ∑ q = 0 ∞ p + q p t 1 2 t 2 2 p + 2 r 1 p r 2 q e i k [2 (p + 1) n 1 a 1 + 2 (p + q + 1) n 2 a 2], where t 1 and r 1 are transmission amplitude and right-reflection amplitude at the vacuum/film interface, t 2 and r 2 are transmission amplitude and right-reflection amplitude at the film/film interface, a 1 is the … A Fabry–Pérot etalon takes advantage of thin film interference to selectively choose which wavelengths of light are allowed to transmit through the device. 0000000676 00000 n Copyright © 2020 Elsevier B.V. or its licensors or contributors. Contact your librarian or system administrator . 0000007456 00000 n Soc. You do not have subscription access to this journal. (4) where Ox is normal to the surface and y = 0 is the plane of incidence. startxref Note the Boolean sign must be in upper-case. You may subscribe either as an OSA member, or as an authorized user of your institution. Exact ray theory for the calculation of the optical generation rate in optically thin solar cells. At normal incidence they can recalculate the expression for reflectance R. You do not have subscription access to this journal. trailer These films are created through deposition processes in which material is added to a substrate in a controlled manner. Jean A. Berning and Peter H. Berning, "Thin Films Calculations Using the IBM 650 Electronic Calculator," J. Opt. Learn more about our response to COVID-19 including information for. 83 0 obj<>stream endstream endobj 66 0 obj<> endobj 67 0 obj<> endobj 68 0 obj<>/ProcSet[/PDF/Text]/ExtGState<>>> endobj 69 0 obj<> endobj 70 0 obj<> endobj 71 0 obj<> endobj 72 0 obj<> endobj 73 0 obj<> endobj 74 0 obj<>stream xref 0000001886 00000 n Click here to see what's new. 50(2) 137-143 (1960), Milton Laikin Citation lists with outbound citation links are available to subscribers only. Soc. Optical Properties of Thin Films 5 The effect of a thin transition layer (thickness ]>> They can be engineered to control the amount of light reflected or transmitted at a surface for a given wavelength. Keep it simple - don't use too many different parameters. Soc. Am. You do not have subscription access to this journal. There is a profound duality between rays and waves. %%EOF . 0000000016 00000 n ELSEVIER Thin SofidFilms 307 (1997) 192-199 thinJ ll~$ Ellipsometric method for investigation of the optical anisotropy of thin films: theory and calculations E.G. We show that inclusion of exact phases is mandatory and that a ray theory without phases may result in amplitude errors of up to 60%. x�b```f``����� p�A�X؀��@��]9�\�l�܅�y�\��mfY��MY 50(3) 295-299 (1960). H�|T�n�0��+x��Z�˲�� Thin film calculator is a program which is embedded in OptiScan which can be used to calculate the amplitude reflection and transmission coefficients, phase change, reflectance and transmittance of both s and p polarized light. Presents an exact ray solution of the 1D Helmholtz equation with a complex refractive index as a model for thin solar cells. Soc. 0000002753 00000 n 0 0000002432 00000 n Am. 0000001174 00000 n By continuing to use this site, you agree to our use of cookies.